In a mass manufacturing facility of superconducting quantum interference devices (SQUIDs), approximately 0.024% of the microchips produced fail the initial low-temperature calibration test. Among the chips that fail, 3 out of 8 failures are due to Josephson junction degradation, while the remaining failures are due to flux trap contamination.
A production run yields a batch of 2.5 × 107 microchips.
Which of the following is the best estimate for the number of microchips in this batch that failed due to flux trap contamination?
2,2502,2502,250
3,7503,7503,750
6,0006,0006,000
37,50037,50037,500
