An optical inspection system uses a converging lens to project a magnified, real image of a microchip defect onto a digital sensor, as shown in the diagram below.
The active vertical span of the sensor is 12.8 mm, and the image of the defect exactly spans this height (so the image height hi=12.8 mmh_i = 12.8\text{ mm}hi=12.8 mm).
The optical configuration produces a linear magnification of 16.0.
Calculate the actual height, hoh_oho, of the microchip defect. Give your answer in micrometres (μm\mu\text{m}μm).