A quality control engineer monitors a semiconductor fabrication process for two specific types of defects: alignment errors (EAE_AEA) and bonding errors (EBE_BEB).
Data from the production line indicates that:
P(EA∩EB)=0.15 P(E_A \cap E_B) = 0.15 P(EA∩EB)=0.15 P(EA′∩EB′)=0.25 P(E_A' \cap E_B') = 0.25 P(EA′∩EB′)=0.25 P(EB)=2P(EA) P(E_B) = 2P(E_A) P(EB)=2P(EA)Find P(EA)P(E_A)P(EA).
Calculate the conditional probability P(EB∣EA)P(E_B | E_A)P(EB∣EA).
Determine if the events EAE_AEA and EBE_BEB are independent.